Publications and patents


TEC and Scintillation short-term forecasting model
The invention relates to the field of ionospheric TEC and scintillation short-term (seconds to minutes) empirical forecasting model. The output of this local model is necessary to feed mitigation algorithms aiming at improving accuracy on GNSS precise positioning techniques (RTK, NRTK, and PPP) under ionospheric harsh conditions. The patent is under registration.


M. Piersanti, M. Materassi, A. Cicone, L. Spogli, H. Zhou and R.G. Ezquer
Adaptive Local Iterative Filtering: A Promising Technique for the Analysis of Nonstationary Signals

M. Piersanti, C. Cesaroni, L. Spogli, T. Alberti,
Does TEC react to a sudden impulse as a whole? The 2015 Saint Patrick’s day storm event, Advances in Space Research, Available online 29 January 2017, ISSN 0273-1177, (

Apponi U., Vincenzo Romano V., De Franceschi G., Del Carlo P., Isola I., Macrì P., Muscari G., Sagnotti L., Spogli L.,Urbini S.
The Istituto Nazionale di Geofisica e Vulcanologia Data Management System for the Arctic Sciences, Journal of Environmental Science and Engineering B 5 (2016) 549-556 doi: 10.17265/2162-5263/2016.11.006

Cesaroni C., Spogli L., Alfonsi L., De Franceschi G., Ciraolo L., J. F. Galera Monico, C. Scotto, V. Romano, M. Aquino, B. Bougard
L-band scintillations and calibrated total electron content gradients over Brazil during the last solar maximum. J. Space Weather Space Clim., 5, A36, 2015, DOI: 10.1051/swsc/2015038.

G. D’Angelo · L. Spogli · C. Cesaroni · V. Sgrigna · L. Alfonsi · M.H.O. Aquino
GNSS data filtering optimization for ionospheric observation, Advances in Space Research Volume 56, Issue 11, 2015, Pages 2552–2562, doi: 10.1016/j.asr.2015.10.002

Eleftherios Plakidis, Vincenzo Romano, Luca Spogli and Giorgiana De Franceschi (2014)
Data Management Strategy for GNSS Services — The TRANSMIT Project Case, Mitigation of Ionospheric Threats to GNSS: an Appraisal of the Scientific and Technological Outputs of the TRANSMIT Project, Dr. Riccardo Notarpietro (Ed.), ISBN: 978-953-51-1642-4, InTech, DOI: 10.5772/58767.